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Characterization of Nb-based superconducting microstrip lines around the gap frequency
Sheng-Cai Shi ; Chi-Chung Chin ; Wen Zhang
2000
Source PublicationInternational Journal of Infrared and Millimeter Waves
Volume21Issue:12Pages:2007-2013
AbstractSubmillimeter-wave SIS (superconductor-insulator-superconductor) mixers usually adopt SIS junctions associated with an integrated tuning circuit, which tunes out the junction's geometric capacitance and is typically an inductive thin-film superconducting microstrip line. This paper mainly investigates the characteristic of Nb-based superconducting microstrip lines around the junction's gap frequency, at which the surface resistance of Nb films becomes considerable, and its effect on the performance of SIS mixers
Subject AreaAstronomy & Astrophysics
Document Type期刊论文
Identifierhttp://libir.pmo.ac.cn/handle/332002/8250
Collection毫米波和亚毫米波技术实验室
Recommended Citation
GB/T 7714
Sheng-Cai Shi,Chi-Chung Chin,Wen Zhang. Characterization of Nb-based superconducting microstrip lines around the gap frequency[J]. International Journal of Infrared and Millimeter Waves,2000,21(12):2007-2013.
APA Sheng-Cai Shi,Chi-Chung Chin,&Wen Zhang.(2000).Characterization of Nb-based superconducting microstrip lines around the gap frequency.International Journal of Infrared and Millimeter Waves,21(12),2007-2013.
MLA Sheng-Cai Shi,et al."Characterization of Nb-based superconducting microstrip lines around the gap frequency".International Journal of Infrared and Millimeter Waves 21.12(2000):2007-2013.
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