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Impedance of Hot-Electron Bolometer Mixers at Terahertz Frequencies
Kollberg, Erik L.1; Yngvesson, K. Sigfrid2; Ren, Yuan3; Zhang, Wen5; Khosropanah, Pourya6; Gao, Jian-Rong3,4
2011-11-01
Source PublicationIEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY
ISSN2156-342X
Volume1Issue:2Pages:383-389
AbstractThis paper discusses the current distribution in thin-film devices, especially in a hot-electron bolometer (HEB) mixer at terahertz frequencies, and the consequences of different current distributions on the device impedance. We first present an approximate analytical model from which we derive a proposed rule of thumb for deciding when the film is thin enough to support a current distribution that is uniform in the transverse direction. We then verify this rule by performing electromagnetic simulations. Our conclusion is that the current distribution in thin films with a relatively high DC resistivity and small film thickness with respect to the skin depth is essentially uniform up to 8 THz. These results are crucial, e. g., for understanding radiation coupling between an HEB and an antenna and indispensable when analyzing detectors and receivers based on bolometric properties of thin films.
KeywordElectromagnetic Simulations Hot-electron Bolometers (Hebs) Low-noise Mixer Receivers Terahertz Thin-film Devices
Subject AreaAstronomy & Astrophysics
WOS HeadingsScience & Technology ; Technology ; Physical Sciences
DOI10.1109/TTHZ.2011.2163550
Indexed BySCI
Language英语
WOS Research AreaEngineering ; Optics ; Physics
WOS SubjectEngineering, Electrical & Electronic ; Optics ; Physics, Applied
WOS IDWOS:000208702900008
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Document Type期刊论文
Identifierhttp://libir.pmo.ac.cn/handle/332002/4436
Collection毫米波和亚毫米波技术实验室
Affiliation1.Chalmers, Dept Microtechnol & Nano Sci, SE-41296 Gothenburg, Sweden
2.Univ Massachusetts, Dept Elect & Comp Engn, Amherst, MA 01003 USA
3.Delft Univ Technol, Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands
4.SRON Netherlands Inst Space Res, NL-3584 CA Utrecht, Netherlands
5.Chinese Acad Sci, Purple Mt Observ, Nanjing 300, Jiangsu, Peoples R China
6.SRON Netherlands Inst Space Res, NL-9747 AD Groningen, Netherlands
Recommended Citation
GB/T 7714
Kollberg, Erik L.,Yngvesson, K. Sigfrid,Ren, Yuan,et al. Impedance of Hot-Electron Bolometer Mixers at Terahertz Frequencies[J]. IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY,2011,1(2):383-389.
APA Kollberg, Erik L.,Yngvesson, K. Sigfrid,Ren, Yuan,Zhang, Wen,Khosropanah, Pourya,&Gao, Jian-Rong.(2011).Impedance of Hot-Electron Bolometer Mixers at Terahertz Frequencies.IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY,1(2),383-389.
MLA Kollberg, Erik L.,et al."Impedance of Hot-Electron Bolometer Mixers at Terahertz Frequencies".IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY 1.2(2011):383-389.
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