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题名: Design and Realization of Charge Measurement System Based on VA32TA5
作者: Ren Yiwen; Guo Jianhua; Wang Shen
刊名: Chinese Journal of Space Science
出版日期: 2016
卷号: 36, 期号:3, 页码:395-400
英文摘要: Semiconductor detector has lots of advantages, such as good resolution, high sensitivity and wide linear range, which make it the most widely used detector in space exploration of X/gamma Ray. Semiconductor detection system has strict requirements on its electronics system's noise level and measurement accuracy. Aiming at these requirements, a new charge measurement system based on the multi-channel charge measurement chip VA32TA5 is designed. This paper gives a detailed introduction of the system's design principle and implementation procedure, and also gives the preliminary results of performance at the end. Testing results indicate that the system has low noise and good linearity and therefore can be applied to semiconductor detectors, e.g. silicon strip detector, CdZnTe detector.
内容类型: 期刊论文
URI标识: http://libir.pmo.ac.cn/handle/332002/16815
Appears in Collections:暗物质和空间天文实验室_期刊论文

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