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题名: Analysis of NbN Hot Electron Bolometer Receiver Noise Temperatures Above 2 THz With a Quantum Noise Model
作者: Khosropanah, Pourya1; Zhang Wen(张文)1, 2; Kollberg, Erik L.3; Yngvesson, K. Sigfrig4; Gao, J. R.5, 6; Bansal, Tarun5, 6; Hajenius, Merlijn5, 6
刊名: IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
出版日期: 2009-06-01
卷号: 19, 期号:3, 页码:274-277
关键词: Heterodyne receiver ; quantum noise ; superconducting hot electron bolometer mixer ; terahertz ; THz mixer
DOI: 10.1109/TASC.2009.2018817
文章类型: Article
英文摘要: This paper summarizes our receiver noise temperature data of NbN HEB mixers obtained at a number of local oscillator frequencies between 1.9 to 4.3 THz in order to verify the role of quantum noise. The experimental data show that the receiver noise temperature increases roughly linearly with frequency. At 4.3 THz, we measured a receiver noise temperature of 1300 K, which is about 6 times (hf/k(B)). The noise data at different frequencies are compared to a prediction of a noise model including the contribution of quantum noise and making use of a hot-spot model for mixing. We draw a preliminary conclusion that at 4.3 THz roughly 30% of the receiver noise temperature can be ascribed to the quantum noise. However, more dedicated measurements are required in order to further support the quantum noise model for HEB mixers.
WOS标题词: Science & Technology ; Technology ; Physical Sciences
类目[WOS]: Engineering, Electrical & Electronic ; Physics, Applied
研究领域[WOS]: Engineering ; Physics
关键词[WOS]: MIXERS
收录类别: SCI ; ISTP
语种: 英语
WOS记录号: WOS:000268282000036
Citation statistics:
内容类型: 期刊论文
URI标识: http://libir.pmo.ac.cn/handle/332002/15901
Appears in Collections:毫米波和亚毫米波技术实验室_期刊论文

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作者单位: 1.SRON, Netherlands Inst Space Res, NL-9747 AD Groningen, Netherlands
2.Chinese Acad Sci, PMO, Nanjing 210008, Jiangsu, Peoples R China
3.Chalmers, Dept Microelect & Nano Sci, SE-41296 Gothenburg, Sweden
4.Univ Massachusetts, Dept Elect & Comp Engn, Amherst, MA 01003 USA
5.SRON, Netherlands Inst Space Res, Utrecht, Netherlands
6.Delft Univ Technol, Kavli Inst NanoSci, Fac Sci Appl, NL-2628 CJ Delft, Netherlands
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